| DC Field | Value | Language |
|---|
| dc.contributor.author | Prischepa, S. L. | - |
| dc.contributor.author | Trezza, M. | - |
| dc.contributor.author | Cirillo, C. | - |
| dc.contributor.author | Attanasio, C. | - |
| dc.date.accessioned | 2016-11-22T09:00:32Z | - |
| dc.date.accessioned | 2017-07-27T12:23:14Z | - |
| dc.date.available | 2016-11-22T09:00:32Z | - |
| dc.date.available | 2017-07-27T12:23:14Z | - |
| dc.date.issued | 2009 | - |
| dc.identifier.citation | Evidence of fractional matching states in nanoperforated Nb thin film grown on porous silicon / M. Trezza and others // EPL. – 2009. – № 88. – Р. 57006-p1 – 57006-p6. | ru_RU |
| dc.identifier.uri | https://libeldoc.bsuir.by/handle/123456789/10180 | - |
| dc.description.abstract | ResistivetransitionshavebeenmeasuredonaperforatedNbthinfilmwithalattice
of holes with period of the order of ten nanometers. Bumps in the dR/dH-vs.-H curves have been
observed at the first matching field and its fractional values, 1/4, 1/9 and 1/16. This effect has
been related to different vortex lattice configurations made available by the underlying lattice of
holes. | ru_RU |
| dc.language.iso | en | ru_RU |
| dc.publisher | EPL | ru_RU |
| dc.subject | публикации ученых | ru_RU |
| dc.title | Evidence of fractional matching states in nanoperforated Nb thin film grown on porous silicon | ru_RU |
| dc.type | Article | ru_RU |
| Appears in Collections: | Публикации в зарубежных изданиях
|
