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dc.contributor.authorPrischepa, S. L.-
dc.contributor.authorFedotov, A. K.-
dc.contributor.authorSvito, I. A.-
dc.contributor.authorRedko, S. V.-
dc.contributor.authorSaad, A.-
dc.contributor.authorMazanik, A. V.-
dc.contributor.authorDolgiy, A. L.-
dc.contributor.authorFedotova, V. V.-
dc.contributor.authorZukowski, P.-
dc.contributor.authorKoltunowicz, T. N.-
dc.identifier.citationCarrier transport in porous-Si/Ni/c-Si nanostructures / A. K. Fedotov [and others] // Journal of Alloys and Compounds. – № 657. – 2016. – P. 21 – 26.ru_RU
dcterms.identifier.DOIDOI: 10.1016/j.jallcom.2015.10.105-
dc.description.abstractIn the present paper we have studied the peculiarities of carrier transport properties of nanoheterostructures containing silicon substrate covered with porous silicon layer, where pores were either filled or non-filled with ferromagnetic Ni clusters. We have carried out DC conductivity experiments as a function of temperature (ranging from 2 to 300 K) and porosity of porous silicon layer (between 30% and 70%). Presence of a surface layer with high resistance on the porous silicon top and its role in nanoheterostructure formation was revealed. It was shown that specific electrochemical kinetics of Ni deposition into porous silicon significantly influences resultant nanostructure resistance and high temperature conductance activation energy.ru_RU
dc.publisherJournal of Alloys and Compoundsru_RU
dc.subjectпубликации ученыхru_RU
dc.subjectPhase transitions in nanocrystallineru_RU
dc.subjectElectrical propertiesru_RU
dc.subjectResistance measurementru_RU
dc.titleCarrier transport in porous-Si/Ni/c-Si nanostructuresru_RU
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