Models describing the degradation of functional parameters of electronic devices based on the Weibull-Gnedenko distribution

Abstract

The authors offer the possibility for obtaining the mathematical model of degradation of a functional parameter in the form of conditional density of its distribution over a given operating time period on the basis of the 3-parametric Weibull-Gnedenko distribution. This model provides reliability prediction errors for samples of electronic devices smaller, than the errors after using the degradation model based on normal distribution of the functional parameter.