| DC Field | Value | Language |
|---|
| dc.contributor.author | Shauchuk, A. G. | - |
| dc.contributor.author | Tsviatkou, V. Yu. | - |
| dc.date.accessioned | 2017-11-29T08:13:53Z | - |
| dc.date.available | 2017-11-29T08:13:53Z | - |
| dc.date.issued | 2016 | - |
| dc.identifier.citation | Shauchuk A. G. Method of normalization of the contour line in thickness based on binary masks / A. G. Shauchk, V. Yu. Tsviatkou // Al-Sadeq International Conference on Multidisciplinary in IT and Communication Science and Applications (AIC-MITCSA), Baghdad, Iraq, 9-10 May 2016. – Baghdad, 2016. – P 1–6. | ru_RU |
| dc.identifier.uri | https://libeldoc.bsuir.by/handle/123456789/28134 | - |
| dc.description.abstract | In this paper propose a method of normalization in thickness of the contour lines based on the analysis by mask of the local orientations of fragments. Comparison of the proposed method with known methods of thinning is held. It is shown that the proposed method is superior to the known methods of thinning on speed and quality. | ru_RU |
| dc.language.iso | en | ru_RU |
| dc.publisher | IEEE | ru_RU |
| dc.subject | публикации ученых | ru_RU |
| dc.subject | algorithm design | ru_RU |
| dc.subject | dispersion | ru_RU |
| dc.subject | brightness | ru_RU |
| dc.subject | quantization (signal) | - |
| dc.subject | radiation detectors | - |
| dc.subject | communications technology | - |
| dc.subject | image processing | - |
| dc.title | Method of normalization of the contour line in thickness based on binary masks | ru_RU |
| dc.type | Статья | ru_RU |
| dc.identifier.DOI | 10.1109/AIC-MITCSA.2016.7759921 | - |
| Appears in Collections: | Публикации в зарубежных изданиях
|
