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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/28939
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dc.contributor.authorWolkenstein, S. S.-
dc.contributor.authorKhmyl, A. A.-
dc.contributor.authorKerentsev, A. F.-
dc.contributor.authorKovalchuk, N. S.-
dc.contributor.authorSolovjov, J. A.-
dc.contributor.authorRubtsevitch, I. I.-
dc.date.accessioned2017-12-29T07:55:44Z-
dc.date.available2017-12-29T07:55:44Z-
dc.date.issued2017-
dc.identifier.citationLazer Photothermoacoustic Microscopy Verification / S. S. Wolkenstein [et al.] // Приборостроение 2017 : материалы 10-ой Международной научно-технической конференции, Минск, 1–3 октября 2017 г. – Минск : БНТУ, 2017. – С. 354–355.ru_RU
dc.identifier.urihttps://libeldoc.bsuir.by/handle/123456789/28939-
dc.description.abstractNew possibilities are opened towards original highly sensitive nondestructive testing method – laser photothermoacoustic microscopy (LPTAM), based on applied physical multigraded principles of faint signals excitation, registration and processing with posterior extraction of useful information concerning permanent coonecrions internal structure with macro-, micro- and sub micro- resolution.ru_RU
dc.language.isoenru_RU
dc.publisherБНТУru_RU
dc.subjectпубликации ученыхru_RU
dc.subjectlaser photothermoacustic microscopyru_RU
dc.subjectLPTAM topogramru_RU
dc.subjectsemiconductor deviceru_RU
dc.titleLazer Photothermoacoustic Microscopy Verificationru_RU
dc.typeСтатьяru_RU
Appears in Collections:Публикации в изданиях Республики Беларусь

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