| DC Field | Value | Language |
|---|
| dc.contributor.author | Mrozek, I. | - |
| dc.contributor.author | Yarmolik, V. N. | - |
| dc.date.accessioned | 2018-01-03T11:51:55Z | - |
| dc.date.available | 2018-01-03T11:51:55Z | - |
| dc.date.issued | 2016 | - |
| dc.identifier.citation | Mrozek, I. Generowanie wieloprzebiegowych kontrolowanych testów losowych / I. Mrozek, V. N. Yarmolik // Elektronika - Konstrucje, Technologie, Zastososwania. – 2016. – №11. – Рр. 99–101. - DOI:10.15199/13.2016.11.21. | ru_RU |
| dc.identifier.uri | https://libeldoc.bsuir.by/handle/123456789/28951 | - |
| dc.description.abstract | Controlled Random Tests and methods for their generation have been analyzed and investigated. The similarities of all known controlled random testing approaches are shown. The new method and algorithm for Multiple Controlled Random Tests have been proposed and analyzed. | ru_RU |
| dc.language.iso | other | ru_RU |
| dc.publisher | KET-PAN (Komitet Elektroniki i Telekomunikacji Polskiej Akademii Nauk | ru_RU |
| dc.subject | публикации ученых | ru_RU |
| dc.subject | random test | ru_RU |
| dc.subject | controlled memory test | ru_RU |
| dc.subject | multiple controlled random tests | ru_RU |
| dc.title | Generowanie wieloprzebiegowych kontrolowanych testów losowych | ru_RU |
| dc.type | Статья | ru_RU |
| Appears in Collections: | Публикации в зарубежных изданиях
|
