| DC Field | Value | Language |
|---|
| dc.contributor.author | Sergeev, O. V. | - |
| dc.contributor.author | Gaponenko, N. V. | - |
| dc.contributor.author | Lazareva, N. G. | - |
| dc.contributor.author | Cramer, R. M. | - |
| dc.contributor.author | Heiderhoff, R. | - |
| dc.contributor.author | Borisenko, V. E. | - |
| dc.contributor.author | Balk, L. J. | - |
| dc.date.accessioned | 2018-03-28T12:16:21Z | - |
| dc.date.available | 2018-03-28T12:16:21Z | - |
| dc.date.issued | 2004 | - |
| dc.identifier.citation | Scanning probe microscopy as a comprehensive microanalytical instrumentary / O. V. Sergeev and others // Доклады БГУИР. - 2004. - № 3 (7). - С. 85 - 94. | ru_RU |
| dc.identifier.uri | https://libeldoc.bsuir.by/handle/123456789/30735 | - |
| dc.description.abstract | This review briefly presents some results of collaborative work on new methods of microanalysis
and nanolithography based on scanning probe microscopy and obtained during long-term coopera-
tion between Center of Nanoelectronics and Novel Materials of Belarusian State University of In-
formatics (Belarus) and Radioelectronics and Bergische Universitдt Wuppertal (Germany). | ru_RU |
| dc.language.iso | en | ru_RU |
| dc.publisher | БГУИР | ru_RU |
| dc.subject | доклады БГУИР | ru_RU |
| dc.subject | microscopy | ru_RU |
| dc.subject | optoelectronics | ru_RU |
| dc.subject | sol-gel structures | ru_RU |
| dc.title | Scanning probe microscopy as a comprehensive microanalytical instrumentary | ru_RU |
| dc.type | Статья | ru_RU |
| Appears in Collections: | №3 (7)
|
