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dc.contributor.authorSergeev, O. V.-
dc.contributor.authorGaponenko, N. V.-
dc.contributor.authorLazareva, N. G.-
dc.contributor.authorCramer, R. M.-
dc.contributor.authorHeiderhoff, R.-
dc.contributor.authorBorisenko, V. E.-
dc.contributor.authorBalk, L. J.-
dc.identifier.citationScanning probe microscopy as a comprehensive microanalytical instrumentary / O. V. Sergeev and others // Доклады БГУИР. - 2004. - № 3 (7). - С. 85 - 94.ru_RU
dc.description.abstractThis review briefly presents some results of collaborative work on new methods of microanalysis and nanolithography based on scanning probe microscopy and obtained during long-term coopera- tion between Center of Nanoelectronics and Novel Materials of Belarusian State University of In- formatics (Belarus) and Radioelectronics and Bergische Universitдt Wuppertal (Germany).ru_RU
dc.subjectдоклады БГУИРru_RU
dc.subjectsol-gel structuresru_RU
dc.titleScanning probe microscopy as a comprehensive microanalytical instrumentaryru_RU
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