The Impact of ESD on Microcontrollers

Abstract

Modern m ethods and means of testing the stability of microcontrollers to the effects of electrostatic discharges are considered. The analysis of functional and operational characteristics of microcontrollers with a program code written in the built-in flash memory is performed. A damage mechanisms classifi­ cation to m icrocontrollers after the influence of electrostatic discharge and the possibility of developing new algorithms for technical diagnostics of microcontrollers are proposed. O n the basis of thermal processes analysis occurring in current-carrying elements of integrated cir­ cuits, the dependence of temperature, electric field strength and power of electromagnetic losses in each element and in their contact areas is shown, depending on the electrostatic discharge voltage. It is shown that electrostatic discharge affects change in programmed data in microcontrollers. The m ethod of functional control of microcontrollers, after exposure to static electricity discharges, developed by the authors is described; this m ethod makes it possible to improve the result of culling of potentially unreliable products by obtaining information about possible violations in the built-in flash memory of microcircuits. The monograph is intended for scientists, engineers, graduate students and undergraduates working in the field of integrated circuits reliability assessment. It can be used by senior courses students of rele­ vant specialties.