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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/38019
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dc.contributor.authorKushitashvili, Z.-
dc.contributor.authorBibilashvili, A.-
dc.contributor.authorBorisenko, V. E.-
dc.date.accessioned2019-12-30T08:31:55Z-
dc.date.available2019-12-30T08:31:55Z-
dc.date.issued2019-
dc.identifier.citationKushitashvili, Z. C-V characterization and electric parameters of ZrO2 received by UV stimulated plasma anodizing / Z. Kushitashvili, A. Bibilashvili, V. Borisenko // IOP Conference Series: Earth and Environmental Science. – 2019. – Vol. 362, № 12. – P. 012070-1-012070-8. - DOI: 10.1088/1755 1315/362/1/012070.ru_RU
dc.identifier.urihttps://libeldoc.bsuir.by/handle/123456789/38019-
dc.description.abstractLow temperature technologies creating metals oxides are a promising solution for formation integral circuit elements. In this report the electric properties of zirconia (ZrO2) received by low temperature (~400oC) UV stimulated plasma anodizing have been investigated. Zirconia is a potential high-k dielectric material with potential applications as a gate insulator in transistors. This dielectric distinguished by good electric parameters. For this purpose, we used C-V characterization technique and calculate dielectric constant, flatband voltage, threshold voltage, bulk potential, work function, oxide effective charge, charge concentration. The C-V measurement was carried out on Keithley Instrument Semiconductor Parameter Analyzer 4200, oxide thickness was measured by reflectometer – MprobeVis System.ru_RU
dc.language.isoenru_RU
dc.publisherIOP Publishing, Great Britainru_RU
dc.subjectпубликации ученыхru_RU
dc.subjectzirconiaru_RU
dc.subjectplasma anodizingru_RU
dc.subjectC-V characterizationru_RU
dc.titleC-V characterization and electric parameters of ZrO2 received by UV stimulated plasma anodizingru_RU
dc.typeСтатьяru_RU
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