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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/45790
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dc.contributor.authorDoudkin, A.-
dc.contributor.authorVoronov, A.-
dc.contributor.authorGanchenko, V.-
dc.contributor.authorДудкин, А. А.-
dc.contributor.authorГанченко, В. В.-
dc.contributor.authorВоронов, А. А.-
dc.date.accessioned2021-11-04T07:57:13Z-
dc.date.available2021-11-04T07:57:13Z-
dc.date.issued2021-
dc.identifier.citationDoudkin, A. Software Control System for Equipment of Integrated Circuit Layout Inspection / Doudkin A., Voronov A., Ganchenko V. // Pattern Recognition and Information Processing (PRIP'2021) = Распознавание образов и обработка информации (2021) : Proceedings of the 15th International Conference, 21–24 Sept. 2021, Minsk, Belarus / United Institute of Informatics Problems of the National Academy of Sciences of Belarus. – Minsk, 2021. – P. 236–240.ru_RU
dc.identifier.urihttps://libeldoc.bsuir.by/handle/123456789/45790-
dc.description.abstractThis paper describes the main functions and architecture of software control system for equipment of critical sizes inspection for layouts of integrated circuit on basis of computer vision. Advantages of the developed architecture are described, as well as its application for image processing of integrated circuit layouts. The system allows identifying effectively defects what it is especially important for Very large-scale integration manufacturing based on submicron technology.ru_RU
dc.language.isoenru_RU
dc.publisherUIIP NASBru_RU
dc.subjectматериалы конференцийru_RU
dc.subjectconference proceedingsru_RU
dc.subjectimage processingru_RU
dc.subjectVLSIru_RU
dc.subjectautomatic layout inspectionru_RU
dc.subjectcontrol and measurement equipmentru_RU
dc.titleSoftware Control System for Equipment of Integrated Circuit Layout Inspectionru_RU
dc.typeСтатьяru_RU
Appears in Collections:Pattern Recognition and Information Processing (PRIP'2021) = Распознавание образов и обработка информации (2021)

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