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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/53935
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dc.contributor.authorKhamets, A. L.-
dc.contributor.authorKhaliava, I. I.-
dc.contributor.authorSafronov, I. V.-
dc.contributor.authorFilonov, A. B.-
dc.contributor.authorMigas, D. B.-
dc.coverage.spatialJapanen_US
dc.date.accessioned2023-12-27T06:49:22Z-
dc.date.available2023-12-27T06:49:22Z-
dc.date.issued2023-
dc.identifier.citationOrientation and size effects on phonon thermal conductivity in silicon/germanium multilayer structures / A. L. Khamets [et al.] // Japanese Journal of Applied Physics. – 2023. – Vol. 62. – P. SD0804.en_US
dc.identifier.urihttps://libeldoc.bsuir.by/handle/123456789/53935-
dc.description.abstractWe study the effect of morphology on the in- and cross-plane phonon thermal conductivity of the (001), (110), and (111) oriented Si/Ge multilayer films by means of non-equilibrium molecular dynamics at 300 K. The extended comparison of the estimated values for the multilayer films to one for the appropriate homogeneous Si and Ge films has been performed. The results revealed a significant advantage in reducing the thermal conductivity of the Si/Ge multilayer films compared to the referenced homogeneous Ge and Si films for the cross-plane transport regardless of the film orientation, and for the in-plane transport only for (001)/[¯ 110 ,] (110)/[001] directions with an increase in the number of periods, which indicated the prospects of such layered structures.en_US
dc.language.isoenen_US
dc.publisherInstitute of Pure and Applied Physicsen_US
dc.subjectпубликации ученыхen_US
dc.subjectSi/Ge multilayer filmsen_US
dc.subjectphonon thermal conductivityen_US
dc.titleOrientation and size effects on phonon thermal conductivity in silicon/germanium multilayer structuresen_US
dc.typeArticleen_US
dc.identifier.DOIhttps://doi.org/10.35848/1347-4065/acad0c-
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