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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/64807
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dc.contributor.authorPanfilenko, E. D.-
dc.contributor.authorProvlockaya, D. V.-
dc.coverage.spatialМинскen_US
dc.date.accessioned2026-07-21T13:40:26Z-
dc.date.available2026-07-21T13:40:26Z-
dc.date.issued2026-
dc.identifier.citationPanfilenko, E. D. Influence of pretreatment methods on the formation of thin-film nickel electrodes for capacitive sensors / E. D. Panfilenko, D. V. Provlockaya // Электронные системы и технологии : сборник материалов 62-й научной конференции аспирантов, магистрантов и студентов БГУИР, Минск, 13–17 апреля 2026 г. / Белорусский государственный университет информатики и радиоэлектроники ; редкол.: П. В. Камлач [и др.]. – Минск, 2026. – С. 831–835.en_US
dc.identifier.urihttps://libeldoc.bsuir.by/handle/123456789/64807-
dc.description.abstractThe paper investigates the influence of pretreatment methods for sitall ST-50-1-1-0,6 substrates surface on the subsequent formation of thin-film nickel electrodes for capacitive sensors for heavy metal ions detection in water. A comparison of two cleaning methods was carried out: ion-beam cleaning in vacuum and treatment in a dielectric barrier discharge plasma torch at atmospheric pressure. Optimal cleaning regimes ensuring maximum adhesion and quality of the formed films were established. Nickel films with a thickness of 100 nm were obtained by ion-beam sputtering; their optical properties and surface morphology were studied.en_US
dc.language.isoenen_US
dc.publisherБГУИРen_US
dc.subjectматериалы конференцийen_US
dc.subjectthin filmsen_US
dc.subjectnickelen_US
dc.subjectsitallen_US
dc.subjection-beam sputteringen_US
dc.subjectatmospheric pressure plasmaen_US
dc.subjectsurface cleaningen_US
dc.subjectcapacitive sensorsen_US
dc.titleInfluence of pretreatment methods on the formation of thin-film nickel electrodes for capacitive sensorsen_US
dc.typeArticleen_US
Appears in Collections:Электронные системы и технологии : материалы 62-й конференции аспирантов, магистрантов и студентов (2026)

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