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Browsing by Author Petlitskaya, T. V.

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Issue DateTitleAuthor(s)
2017Depth Measurement of the Nano-dimensional Surface Damages of the Silicon Wafers in Production of the Submicron Integrated CircuitsSolodukha, V. A.; Shvedov, S. V.; Chyhir, R. R.; Petlitsky, A. N.; Petlitskaya, T. V.
2017Structural and optical properties of nano-granular In2S3 filmsGremenok, V. F.; Khoroshko, V. V.; Tsyrelchuk, I. N.; Sereda, A. S.; Petlitskaya, T. V.; Piatlitski, A. N.; Ramakrishna Reddy, K. T.; Rasool, S.