Browsing by Author Petlitskaya, T. V.
Showing results 1 to 2 of 2
| Issue Date | Title | Author(s) |
| 2017 | Depth Measurement of the Nano-dimensional Surface Damages of the Silicon Wafers in Production of the Submicron Integrated Circuits | Solodukha, V. A.; Shvedov, S. V.; Chyhir, R. R.; Petlitsky, A. N.; Petlitskaya, T. V. |
| 2017 | Structural and optical properties of nano-granular In2S3 films | Gremenok, V. F.; Khoroshko, V. V.; Tsyrelchuk, I. N.; Sereda, A. S.; Petlitskaya, T. V.; Piatlitski, A. N.; Ramakrishna Reddy, K. T.; Rasool, S. |
