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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/10180
Title: Evidence of fractional matching states in nanoperforated Nb thin film grown on porous silicon
Authors: Trezza, M.
Cirillo, C.
Prischepa, S. L.
Attanasio, C.
Keywords: публикации ученых
Issue Date: 2009
Publisher: EPL
Citation: Evidence of fractional matching states in nanoperforated Nb thin film grown on porous silicon / M. Trezza [et al.] // Europhysics Letters. – 2009. – Volume 88, Number 5. – Р. 57006.
Abstract: Resistive transitions have been measured on a perforated Nb thin film with a lattice of holes with period of the order of ten nanometers. Bumps in the dR/dH-vs.-H curves have been observed at the first matching field and its fractional values, 1/4, 1/9 and 1/16. This effect has been related to different vortex lattice configurations made available by the underlying lattice of holes.
URI: https://libeldoc.bsuir.by/handle/123456789/10180
DOI: https://doi.org/10.1209/0295-5075/88/57006
Appears in Collections:Публикации в зарубежных изданиях

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