Models describing the degradation of functional parameters of electronic devices based on the Weibull–Gnedenko distribution

Abstract

The authors offer the possibility for obtaining the mathematical model of degradation of a functional parameter in the form of conditional density of its distribution over a given operating time period on the basis of the 3-parametric Weibull–Gnedenko distribution. This model provides reliability prediction errors for samples of electronic devices smaller, than the errors after using the degradation model based on normal distribution of the functional parameter