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dc.contributor.authorSolodukha, V. A.-
dc.contributor.authorShvedov, S. V.-
dc.contributor.authorChyhir, R. R.-
dc.contributor.authorPetlitsky, A. N.-
dc.contributor.authorFilipenya, V. A.-
dc.identifier.citationReliability Assessment of the Nano-dimensional Dielectrics of the Submicron Microcircuits / V. A. Solodukha and other // 10th International Conference «New Electrical and Electronic Technologies and their Industrial Implementation» (June 27 – 30, 2017). – Zakopane. – Р. 24.ru_RU
dc.publisherZakopane, Polandru_RU
dc.subjectпубликации ученыхru_RU
dc.titleReliability Assessment of the Nano-dimensional Dielectrics of the Submicron Microcircuitsru_RU
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