| DC Field | Value | Language |
|---|
| dc.contributor.author | Solodukha, V. A. | - |
| dc.contributor.author | Shvedov, S. V. | - |
| dc.contributor.author | Chyhir, R. R. | - |
| dc.contributor.author | Petlitsky, A. N. | - |
| dc.contributor.author | Filipenya, V. A. | - |
| dc.date.accessioned | 2017-12-20T08:09:20Z | - |
| dc.date.available | 2017-12-20T08:09:20Z | - |
| dc.date.issued | 2017 | - |
| dc.identifier.citation | Reliability Assessment of the Nano-dimensional Dielectrics of the Submicron Microcircuits / V. A. Solodukha and other // 10th International Conference «New Electrical and Electronic Technologies and their Industrial Implementation» (June 27 – 30, 2017). – Zakopane. – Р. 24. | ru_RU |
| dc.identifier.uri | https://libeldoc.bsuir.by/handle/123456789/28804 | - |
| dc.language.iso | en | ru_RU |
| dc.publisher | Zakopane | ru_RU |
| dc.subject | публикации ученых | ru_RU |
| dc.title | Reliability Assessment of the Nano-dimensional Dielectrics of the Submicron Microcircuits | ru_RU |
| dc.type | Статья | ru_RU |
| Appears in Collections: | Публикации в зарубежных изданиях
|
