XPS study of graphene grown by atmospheric pressure CVD from n-decane precursor with nitrogenasa carrier gas

Abstract

We present X-ray photoelectron spectroscopy study (XPS) of graphene films grown on copper foil by atmospheric pressure CVD with n-decane as a precursor, a mixture of nitrogen and hydrogen as a carrier gas, under different hydrogen flow rates. The XPS study revealed the characteristics of incorporated nitrogen, which was found to have a binding energy around 402 eV, the atomic concentration of incorporated nitrogen is higher for the sample synthesized with higher hydrogen flow rate.