Skip navigation
Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/43124
Title: Depth dependent X-ray diffraction of porous anodic alumina films filled with cubic YAlO3:Tb3+ matrix
Authors: Serafińczuk, J.
Pawlaczyk, Ł.
Podhorodecki, A.
Gaponenko, N. V.
Molchan, I. S.
Thompson, G.
Гапоненко, Н. В.
Молчан, И. С.
Keywords: публикации ученых
porous anodic alumina
X-ray diffraction
Issue Date: 2020
Publisher: Wrocław University of Science and Technology, Республика Польша
Citation: Depth dependent X-ray diffraction of porous anodic alumina films filled with cubic YAlO3:Tb3+ matrix / J. Serafińczuk [et. al.] // Optica Applicata. – 2020. – Vol.50, № 1. – P. 127–134. – DOI: 10.37190/oa200110.
Abstract: The presented paper deals with the measurement methodologies of the structural properties of porous anodic alumina (PAA) films filled with YAlO3:Tb3+ composite using X-ray diffraction, atomic force microscopy and scanning electron microscopy. It shows that the deposited material does not uniformly fill the porous volume of the anodic alumina film and the part of it forms a thick layer on the PAA surface. The aim of this work is to show the differences in the XRD response obtained at different angles of incidence of the excitation beam for the PAA/YAlO3:Tb3+ system. Furthermore, this simple approach enables separation of the signal from both regions on the surface and inside the PAA pores, providing more accurate data interpretation. It reveals that the crystallization of the material on the PAA surface and within the pores is different.
URI: https://libeldoc.bsuir.by/handle/123456789/43124
Appears in Collections:Публикации в зарубежных изданиях

Files in This Item:
File Description SizeFormat 
Optica Applicata_2020.pdf655,29 kBAdobe PDFView/Open
Show full item record


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.