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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/53937
Title: Ca silicide films—promising materials for silicon optoelectronics
Authors: Galkin, N. G.
Galkin, K. N.
Goroshko, D. L.
Dotsenko, S. A.
Kropachev, O. V.
Chernev, I. M.
Subbotin, E. Y.
Alekseev, A. Yu.
Migas, D. B.
Fogarassy, Z.
Pecz, B.
Gutakovskii, A. K.
Keywords: публикации ученых;calcium silicides;optical properties;optoelectronics
Issue Date: 2023
Publisher: Institute of Pure and Applied Physics
Citation: Ca silicide films—promising materials for silicon optoelectronics / N. G. Galkin [et al.] // Japanese Journal of Applied Physics. – 2023. – Vol. 62. – P. SD0803.
Abstract: Single-phase films of semiconductor and semimetallic calcium silicides (Ca2Si, CaSi, and CaSi2), as well as films with a significant contribution of Ca5Si3 and Ca14Si19 silicides, were grown on single-crystal silicon and sapphire substrates. The analysis of the crystal structure of the grown films was carried out and the criterion of their matching with silicon and sapphire substrates was determined. Some lattice-matching models were proposed, and the subsequent deformations of the silicide lattices were estimated. Film’s optical functions, including the optical transparency, were calculated from the optical spectroscopy data and an extended comparison was performed with the results of ab initio calculations. The real limits of the optical transparency for the films on sapphire substrates were established. The maximum transparency limit (3.9 eV) was observed for the CaSi film. Based on an analysis of the photoelectric properties of Ca2Si/Si diodes on n- and p-type silicon substrates, a perspective of their applications in silicon optoelectronics was discussed.
URI: https://libeldoc.bsuir.by/handle/123456789/53937
DOI: DOI: 10.35848/1347-4065/aca0fd
Appears in Collections:Публикации в зарубежных изданиях

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