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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/28134
Title: Method of normalization of the contour line in thickness based on binary masks
Authors: Shauchuk, A. G.
Tsviatkou, V. Yu.
Keywords: публикации ученых
normalization of the contour lines in thickness
the mask analysis
thinning
Issue Date: 2016
Publisher: IEEE, USA
Citation: Shauchuk A. G. Method of normalization of the contour line in thickness based on binary masks / A. G. Shauchk, V. Yu. Tsviatkou // Sadeq International Conference on Multidisciplinary in IT and Communication Science and Applications (AIC-MITCSA) (IEEE Conference Publications), 9-10 May. – 2016. – 6 pp.
Abstract: We propose a method of normalization in thickness of the contour lines based on the analysis by mask of the local orientations of fragments. Comparison of the proposed method with known methods of thinning is held. It is shown that the proposed method is superior to the known methods of thinning on speed and quality.
URI: https://libeldoc.bsuir.by/handle/123456789/28134
Appears in Collections:Публикации в зарубежных изданиях

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