https://libeldoc.bsuir.by/handle/123456789/28134
Название: | Method of normalization of the contour line in thickness based on binary masks |
Авторы: | Shauchuk, A. G. Tsviatkou, V. Yu. |
Ключевые слова: | публикации ученых;normalization of the contour lines in thickness;the mask analysis;thinning |
Дата публикации: | 2016 |
Издательство: | IEEE |
Описание: | Shauchuk A. G. Method of normalization of the contour line in thickness based on binary masks / A. G. Shauchk, V. Yu. Tsviatkou // Sadeq International Conference on Multidisciplinary in IT and Communication Science and Applications (AIC-MITCSA) (IEEE Conference Publications), 9-10 May. – 2016. – 6 pp. |
Аннотация: | We propose a method of normalization in thickness of the contour lines based on the analysis by mask of the local orientations of fragments. Comparison of the proposed method with known methods of thinning is held. It is shown that the proposed method is superior to the known methods of thinning on speed and quality. |
URI: | https://libeldoc.bsuir.by/handle/123456789/28134 |
Располагается в коллекциях: | Публикации в зарубежных изданиях |
Файл | Описание | Размер | Формат | |
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Shauchuk_Method.pdf | 171.25 kB | Adobe PDF | Открыть |
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