| Title: | Lazer Photothermoacoustic Microscopy Verification |
| Keywords: | публикации ученых;laser photothermoacustic microscopy;LPTAM topogram;semiconductor device |
| Issue Date: | 2017 |
| Publisher: | БНТУ |
| Citation: | Wolkenstein, S. S. Lazer Photothermoacoustic Microscopy Verification / S. S. Wolkenstein, A. A. Khmyl // Приборостроение 2017: материалы 10-ой Международной научно-технической конференции (Минск, 1 – 3 октября 2017 г.). – Минск: БНТУ, 2017. – С. 354 – 355. |
| Abstract: | New possibilities are opened towards original highly sensitive nondestructive testing method – laser photothermoacoustic microscopy (LPTAM), based on applied physical multigraded principles of faint signals excitation, registration and processing with posterior extraction of useful information concerning permanent coonecrions internal structure with macro-, micro- and sub micro- resolution. |
| URI: | https://libeldoc.bsuir.by/handle/123456789/28939 |
| Appears in Collections: | Публикации в изданиях Республики Беларусь
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