https://libeldoc.bsuir.by/handle/123456789/30735| Title: | Scanning probe microscopy as a comprehensive microanalytical instrumentary |
| Authors: | Sergeev, O. V. Gaponenko, N. V. Lazareva, N. G. Cramer, R. M. Heiderhoff, R. Borisenko, V. E. Balk, L. J. |
| Keywords: | доклады БГУИР;microscopy;optoelectronics;sol-gel structures |
| Issue Date: | 2004 |
| Publisher: | БГУИР |
| Citation: | Scanning probe microscopy as a comprehensive microanalytical instrumentary / O. V. Sergeev and others // Доклады БГУИР. - 2004. - № 3 (7). - С. 85 - 94. |
| Abstract: | This review briefly presents some results of collaborative work on new methods of microanalysis and nanolithography based on scanning probe microscopy and obtained during long-term coopera- tion between Center of Nanoelectronics and Novel Materials of Belarusian State University of In- formatics (Belarus) and Radioelectronics and Bergische Universitдt Wuppertal (Germany). |
| URI: | https://libeldoc.bsuir.by/handle/123456789/30735 |
| Appears in Collections: | №3 (7) |
| File | Description | Size | Format | |
|---|---|---|---|---|
| Sergeev_Scanning.pdf | 1.44 MB | Adobe PDF | View/Open |
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