|Title:||Scanning probe microscopy as a comprehensive microanalytical instrumentary|
|Authors:||Sergeev, O. V.|
Gaponenko, N. V.
Lazareva, N. G.
Cramer, R. M.
Borisenko, V. E.
Balk, L. J.
|Keywords:||доклады БГУИР;microscopy;optoelectronics;sol-gel structures|
|Citation:||Scanning probe microscopy as a comprehensive microanalytical instrumentary / O. V. Sergeev and others // Доклады БГУИР. - 2004. - № 3 (7). - С. 85 - 94.|
|Abstract:||This review briefly presents some results of collaborative work on new methods of microanalysis and nanolithography based on scanning probe microscopy and obtained during long-term coopera- tion between Center of Nanoelectronics and Novel Materials of Belarusian State University of In- formatics (Belarus) and Radioelectronics and Bergische Universitдt Wuppertal (Germany).|
|Appears in Collections:||№3 (7)|
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