https://libeldoc.bsuir.by/handle/123456789/30735
Title: | Scanning probe microscopy as a comprehensive microanalytical instrumentary |
Authors: | Sergeev, O. V. Gaponenko, N. V. Lazareva, N. G. Cramer, R. M. Heiderhoff, R. Borisenko, V. E. Balk, L. J. |
Keywords: | доклады БГУИР;microscopy;optoelectronics;sol-gel structures |
Issue Date: | 2004 |
Publisher: | БГУИР |
Citation: | Scanning probe microscopy as a comprehensive microanalytical instrumentary / O. V. Sergeev [et al.] // Доклады БГУИР. – 2004. – № 3 (7). – С. 85–94. |
Abstract: | This review briefly presents some results of collaborative work on new methods of microanalysis and nanolithography based on scanning probe microscopy and obtained during long-term cooperation between Center of Nanoelectronics and Novel Materials of Belarusian State University of Informatics (Belarus) and Radioelectronics and Bergische Universitдt Wuppertal (Germany). |
URI: | https://libeldoc.bsuir.by/handle/123456789/30735 |
Appears in Collections: | №3 (7) |
File | Description | Size | Format | |
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Sergeev_Scanning.pdf | 1.44 MB | Adobe PDF | View/Open |
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