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Title: Scanning probe microscopy as a comprehensive microanalytical instrumentary
Authors: Sergeev, O. V.
Gaponenko, N. V.
Lazareva, N. G.
Cramer, R. M.
Heiderhoff, R.
Borisenko, V. E.
Balk, L. J.
Keywords: доклады БГУИР;microscopy;optoelectronics;sol-gel structures
Issue Date: 2004
Publisher: БГУИР
Citation: Scanning probe microscopy as a comprehensive microanalytical instrumentary / O. V. Sergeev and others // Доклады БГУИР. - 2004. - № 3 (7). - С. 85 - 94.
Abstract: This review briefly presents some results of collaborative work on new methods of microanalysis and nanolithography based on scanning probe microscopy and obtained during long-term coopera- tion between Center of Nanoelectronics and Novel Materials of Belarusian State University of In- formatics (Belarus) and Radioelectronics and Bergische Universitдt Wuppertal (Germany).
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