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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/43940
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dc.contributor.authorPetrovskaya, V. V.-
dc.contributor.authorDemenkovets, D. V.-
dc.date.accessioned2021-06-08T06:42:59Z-
dc.date.available2021-06-08T06:42:59Z-
dc.date.issued2021-
dc.identifier.citationPetrovskaya, V. V. The basics of memory fault detection with march tests / V. V. Petrovskaya, D. V. Demenkovets // Проблемы экономики и информационных технологий : сборник тезисов и статей докладов 57-ой научной конференции аспирантов, магистрантов и студентов БГУИР, Минск, 19-21 апреля 2021 г. / Белорусский государственный университет информатики и радиоэлектроники. – Минск, 2021. – С. 329–330.ru_RU
dc.identifier.urihttps://libeldoc.bsuir.by/handle/123456789/43940-
dc.description.abstractThe article focuses on detecting memory matrix faults. The trends in the evolution of storage devices are considered and the generalized memory model is provided. The classification of single-cell fault models and the dominant testing method are given. The article shows the advantages and disadvantages of march tests.ru_RU
dc.language.isoenru_RU
dc.publisherБГУИРru_RU
dc.subjectматериалы конференцийru_RU
dc.subjectmemory system testingru_RU
dc.subjectsingle-cell faultsru_RU
dc.subjectmarch testsru_RU
dc.titleThe basics of memory fault detection with march testsru_RU
dc.typeСтатьяru_RU
Appears in Collections:Проблемы экономики и информационных технологий : материалы 57-й научной конференции аспирантов, магистрантов и студентов (2021)

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