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Please use this identifier to cite or link to this item: https://libeldoc.bsuir.by/handle/123456789/43940
Title: The basics of memory fault detection with march tests
Authors: Petrovskaya, V. V.
Demenkovets, D. V.
Keywords: материалы конференций;memory system testing;single-cell faults;march tests
Issue Date: 2021
Publisher: БГУИР
Citation: Petrovskaya, V. V. The basics of memory fault detection with march tests / V. V. Petrovskaya, D. V. Demenkovets // Проблемы экономики и информационных технологий : сборник тезисов и статей докладов 57-ой научной конференции аспирантов, магистрантов и студентов БГУИР, Минск, 19-21 апреля 2021 г. / Белорусский государственный университет информатики и радиоэлектроники. – Минск, 2021. – С. 329–330.
Abstract: The article focuses on detecting memory matrix faults. The trends in the evolution of storage devices are considered and the generalized memory model is provided. The classification of single-cell fault models and the dominant testing method are given. The article shows the advantages and disadvantages of march tests.
URI: https://libeldoc.bsuir.by/handle/123456789/43940
Appears in Collections:Проблемы экономики и информационных технологий : материалы 57-й научной конференции аспирантов, магистрантов и студентов (2021)

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