Showing results 1 to 20 of 29
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| Issue Date | Title | Author(s) |
| 2020 | 3D core-shell WO3@ α-Fe2O3 photoanode modified by ultrathin FeOOH layer for enhanced photoelectrochemical performances | Zhang, J.; Zhu, G.; Liu, W.; Xi, Y.; Golosov, D. A.; Zavadski, S.M.; Melnikov, S. N. |
| 2025 | Back-end-of-line compatible Hf0.5Zr0.5O2 ferroelectric devices enabled by microwave annealing | Yinchi Liu; Hao Zhang; Jining Yang; Golosov, D. A.; Xiaohan Wu; Chenjie Gu; Shijin Ding; Wenjun Liu |
| 2017 | Balanced magnetic field in magnetron sputtering systems | Golosov, D. A. |
| 2018 | Discharge and plasma characteristics of pulse enhanced vacuum arc evaporation (PEVAE) for titanium cathode | Yinghe Ma; Chunzhi Gong; Qinwen Tian; Paul K. Chu; Golosov, D. A.; Xiubo Tian |
| 2022 | Effect of Li+ doping on photoelectric properties of double perovskite Cs2SnI6: first principles calculation and experimental investigation | Jin, Z.; Chen, Y.; Yulong, L.; Shijie, L.; Pengfei, Y.; Yingxue, X.; Weiguo, L.; Golosov, D. A.; Zavadski, S. M.; Melnikov, S. N. |
| 2020 | Effect of the Degree of Aluminum Doping on the Mechanical and Tribological Characteristics of Titanium-Aluminum Nitride Films | Golosov, D. A.; Oks, E. M.; Burdovitsin, V. A.; Nguyen, T. D.; Melnikov, S. N.; Zavadski, S. M.; Pobol, I. L.; Kananovich, N. A.; Tian, Xiubo; Lam, N. N. |
| 2019 | Electron beam nitriding of titanium in medium vacuum | Burdovitsin, V. A.; Golosov, D. A.; Oks, E. M.; Tyunkov, A. V.; Yushkov, Yu. G.; Zolotukhin, D. B.; Zavadski, S |
| 2019 | Enhanced discharge and surface properties of (Ti,AlCr)N coatings by cleaning cathodic-arc chamber | Kong, Y.; Tian, X.; Gong, C.; Golosov, D. A.; Li, M.; Tian, Q. |
| 2024 | Enhanced Ferroelectricity and Reliability in Sub-6 nm Ferroelectric Hf0.5Zr0.5O2/ZrO2/Hf0.5Zr0.5O2 Stack Film Compatible with BEOL Proces | Yinchi Liu; Jining Yang; Hao Zhang; Golosov, D. A.; Chenjie Gu; Xiaohan Wu; Hongliang Lu; Lin Chen; Shijin Ding; Wenjun Liu |
| 2025 | Enhanced memory window and reliability of α-IGZO FeFET enabled by atomic-layer-deposited HfO2 interfacial layer | Yinchi Liu; Xun Lu; Shiyu Li; Hao Zhang; Jining Yang; Yeye Guo; Golosov, D. A.; Chenjie Gu; Hongliang Lu; Zhigang Ji; Shijin Ding; Wenjun Liu |
| 2016 | Ferroelectric properties of niobium-doped strontium-bismuth tantalate | Golosov, D. A.; Zavadski, S. M.; Kolos, V. V.; Turtsevich, A. S. |
| 2025 | High performance and nearly wake-up free Hf0.5Zr0.5O2 ferroelectric capacitor realized by middle layer strategy with BEOL compatibility | Yin-Chi Liu; Gen-Ran Xie; Ji-Ning Yang; Hao Zhang; Golosov, D. A.; Chenjie Gu; Bao Zhu; Xiaohan Wu; Hong-Liang Lu; Shi-Jin Ding; Wenjun Liu |
| 2019 | Influence of film thickness on the dielectric characteristics of hafnium oxide layers | Golosov, D. A.; Vilya, N.; Zavadski, S.M.; Melnikov, S. N.; Avramchuck, A. V.; Grekhov, M.M.; Kargin, N. I.; Komissarov, I. V. |
| 2017 | Influence of target-substrate distance during pulsed laser deposition on properties of LiNbO3 thin films | Vakulov, Z. E.; Zamburg, E. G.; Golosov, D. A.; Zavadski, S.M.; Dostanko, A. P.; Miakonkikh, A. V.; Klemente, I. E.; Rudenko, K. V.; Ageev, O. A. |
| 2016 | Influence of the annealing temperature on the ferroelectric properties of niobium-doped strontium-bismuth tantalate | Golosov, D. A.; Zavadski, S. M.; Kolos, V. V.; Turtsevich, A. S.; Okodzhi, D. E. |
| 2025 | Influence of zirconium doping on the dielectric properties of hafnium oxide films | Golosov, D. A.; Zhang, J.; Zavadski, S. M.; Melnikov, S. N.; Doan, H. T.; Alexandrovitch, P. A. |
| 2019 | Investigation of Band Alignment for Hybrid 2D-MoS2/3D-β-Ga2O3 Heterojunctions with Nitridation | Huan, Y. W.; Xu, K.; Liu, W. J.; Zhang, H.; Golosov, D. A.; Xia, C. T.; Yu, H. Y.; Wu, X. H.; Sun, Q. Q.; Ding, S. J. |
| 2019 | Investigation of energy band at atomic layer deposited AZO/β-Ga2O3(201) heterojunctions | Sun, S. M.; Liu, W. J.; Golosov, D. A.; Gu, C. J.; Ding, S. J. |
| 2019 | Microstructure and mechanical properties of ta-C films by pulse-enhanced cathodic arc evaporation: Effect of pulsed current | Hu, J.; Tian, Q.; Wan, P.; Chen, B.; Tian, X.; Gong, C.; Golosov, D. A. |
| 2019 | Microstructure and mechanical properties of Ti-Al-Cr-N films: Effect of current of additional anode | Kong, Y.; Tian, X.; Gong, C.; Tian, Q.; Yang, D.; Wu, M.; Li, M.; Golosov, D. A. |
